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Selective Ion Monitoring (SIM) for Low Level Applications in Vapor Samples

October 3rd, 2003

Selective-Ion-Monitoring-for-Low-Level-Applications-in-Vapor-SamplesGas chromatography/mass spectrometry (GC/MS) is the method of choice for the identification of volatile organic compounds (VOCs) in vapor samples (e.g. EPA methods TO-14A and TO-15). As various state and federal agencies more frequently require facilities to address risk-based concentrations, such as the low level preliminary remediation goals (PRGs), they find that the standard method is not able to reach the ultra-low levels needed. To address these requirements, CAS’ Simi Valley, California lab has developed a method using selective ion monitoring (SIM) to measure the compounds. SIM is a sensitivity enhancement technique, where the mass spectrometer is programmed to scan for only those ions that are pertinent to the compounds of interest (2-3 mass ions scanned per compound) while ignoring non-essential ions. The mass spectrometer becomes a highly sensitive compound-specific detector.

The driving force for the lower limits has been health risk assessment activities in the indoor and ambient air arena. The exposure criteria for many compounds are being re-evaluated constantly. A recent symposium sponsored by the Groundwater Resources Association (GRA) on subsurface vapor intrusion to indoor air has recommended that the SIM analytical technique be used. For example, trichloroethene (TCE) will have a reporting limit of 1.0 mg/m3 (0.19 ppbv) using the standard full scan method. In contrast, the reporting limit of 0.05 mg/m3 (0.0093 ppbv) for TCE will be achieved with the SIM technique. This meets or exceeds most risk-based concentration criteria. Lower limits are occasionally requested and are reviewed on a case-by-case basis.

These applications typically require a 6-liter evacuated summa canister equipped with low volume flow controller to collect time-integrated VOC samples. To minimize contamination and ensure against false positive results, it is important that canisters and flow controllers be individually certified down to the reporting limits. For less demanding projects, where full scan reporting limits are adequate, batch certification (one per ten) of canisters is acceptable.

Using GC/MS in the SIM mode is a valuable tool for investigating situations where ultra-low level reporting limits are desired. Compound lists and reporting limits are constantly being reviewed and revised.

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