CAS is currently able to provide analytical support for compliance with the April 2005 document from the Joint Industry Guide (JIG), “Material Composition Declaration for Electronics Products”, JIG-101. All constituents listed in Annex A and Annex B that have an associated “Threshold Level” can be performed at CAS. While this document is outside the scope of RoHS, mention of it is made in this report because of the similar nature of the two operatives. Whether performing chemical analyses under RoHS or JIG-101, the sample homogenization techniques are identical. In addition, analysis for PBDEs, PBBs, and selected metals are also performed the same for JIG-101 as for RoHS. Some of the other parameters require different analytical techniques, but are within the scope of CAS’ capabilities.

Also listed in Annex A and Annex B are compounds and classes of compounds that are accompanied by “Intentionally Added” as the “Threshold Level”. For these constituents, chemical analysis probably will not be necessary the majority of the time, but CAS is capable of performing support for testing of those parameters as well